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Timing Closure Requires Up-Front Work
By Ted Williams
Successful timing achieved on first silicon
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Fault Coverage Vies for Clear DFT Rules
By Luke L. Chang
Part 2 of a two-part discussion of full-scan testing
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Hybrid Architecture Takes Digital Picture
By Jeffery M. Arnold and Neal Stollon
SoC components are applied to digital still photography
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Converting FPGAs to ASICS for SoC Designs
By Vince Hopkins
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Self-Repair Boosts Memory SoC Yields
By Vincent Ratford
Algorithim vastly improves SoC yields
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New Models Sought for Less Than 0.13 Micron
By Xisheng Zhang and Mark C. Williams
Deep-submicron designs require different modeling
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Editorial
By Ron Wilson
Timing's everything, everything's timed
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Working Papers
By Warren Miller, Peter Kwan and Kent Narveson
FPGA designs need timing closure path
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Viewpoint
By Sean Dart
Integrate tools for effective verification
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